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By Kash L. Mittal

This e-book chronicles the court cases of the 1st foreign Symposium on Adhesion features of skinny motion pictures held less than the auspices of MST meetings in Newark, New Jersey, October 28-29, 1999.

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3 confirms this. The X-ray diffraction patterns of the samples grown at different momentum transfer parameters present different features, as observed in Fig. 4 for IBAD deposited hafnia thin films. The samples can be divided in three different groups. S. Scaglione et al. 40 Table 1. Deposition parameters of e-gun Xe ion assisted deposited hafnia thin film. E b and I b are the energy and the ion current, respectively, of Xe ion beam. 08 + , 0 , , 50 , , 100 . eV)’” Figure 3. Refractive index of HfO2 thin film at i = 310 nm for different momentum transfer parameters, P .

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